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Author
Roy, Avishek (1)
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Year of publication
2021
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Document Type
Article
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Language
English
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X-ray diffraction (1)
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Institut für Physik (1)
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MDPI
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Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering
(2021)
Mukhopadhyay, Arun Kumar
;
Roy, Avishek
;
Bhattacharjee, Gourab
;
Das, Sadhan Chandra
;
Majumdar, Abhijit
;
Wulff, Harm
;
Hippler, Rainer
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